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Category:Native Instruments Category:Software synthesizers Category:Windows-only software Category:Kontakt (audio plug-in)U.S. Pat. No. 4,668,603 describes an apparatus for measuring the tensile modulus of material. The modulus of an elastic material can be used as an index of hardness. However, the modulus of a hard material like glass can be very high, for example, it is above 10.sup.5 MPa. Thus it would be desirable to have an apparatus capable of measuring the modulus of a material over a wide range. U.S. Pat. No. 5,249,543 describes a modulus measuring system that uses a glass block with three tension strain gauges attached at its corners. A known load is applied to the center of the glass block. A computer receives signals from the strain gauges and calculates a modulus based on a theory described in U.S. Pat. No. 4,668,603. The block is placed on a flat surface, which is then transferred to a three-dimensional coordinate measuring machine. A second block made of metal is placed against the glass block and the distance between the glass block and the metal block is measured. The modulus of the metal block and the glass block are subtracted and the resulting value is the modulus of the glass block. This method is subject to inaccuracies in measuring the positions of the blocks, and errors in converting the position of the glass block to a modulus. The apparatus described in U.S. Pat. No. 5,249,543 is also quite complex and costly. An apparatus for measuring the modulus of an object is disclosed in WO 97/47243. The apparatus uses a deformable probe with a strain gauge attached to a thin layer of a load-bearing material. The thickness of the load-bearing material is chosen so that it is the same thickness as the thickness of the probe. A known load is applied to the probe. A computer monitors the signal from the strain gauge and calculates a modulus based on a theory described in U.S. Pat. No. 4,668,603. The object can be an object that is placed on a flat surface, or it can be an object that is placed on an uneven surface. The apparatus described in WO 97/47243 does not detect the position of the object. Thus, an object that is located on the surface of a thick

 

 

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